Title :
High loss multilayer films for control of electro-magnetic interference
Author :
Wen, Deng Lian ; Kun, Feng Ze ; Jun, Jiang Jian ; Cheng, Zhang Xiu ; He Hua Hui
Author_Institution :
Dept. of Electron. Sci. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
A nanostructure multilayer film, composed of magnetic alloy CoFeZrNd layer and nonmagnetic insulator SiO2 layer, was adopted as the composite structure material. The CoFeZrNd/SiO2 multilayer films were synthesized by magnetron sputtering. Microstructures, electromagnetic parameters and microwave characteristics were all measured and analysed. Results show that these magnetic nanostructure multilayer films can be used in control of EMI in circuits and systems.
Keywords :
cobalt alloys; electromagnetic interference; ferromagnetic materials; insulators; iron alloys; magnetic multilayers; magnetic thin films; nanostructured materials; neodymium alloys; silicon compounds; sputtering; zirconium alloys; CoFeZrNd-SiO2; EMI; composite structure material; electromagnetic interference control; electromagnetic parameters; high loss multilayer films; magnetic alloy; magnetic nanostructure multilayer film; magnetron sputtering; microwave characteristics; nonmagnetic insulator; Circuit synthesis; Composite materials; Control system synthesis; Insulation; Interference; Magnetic films; Magnetic materials; Magnetic multilayers; Nanostructured materials; Nonhomogeneous media;
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2005. MAPE 2005. IEEE International Symposium on
Print_ISBN :
0-7803-9128-4
DOI :
10.1109/MAPE.2005.1617971
