DocumentCode :
1640705
Title :
Influence of outside environment on transient grounding resistance under pulsed discharging current
Author :
Hongbing, He ; Bihua, Zhou ; Jiaqing, Chen ; Heming, Ren
Author_Institution :
Lab. of EMP, Nanjing Eng. Inst., China
Volume :
1
fYear :
2005
Firstpage :
565
Abstract :
This paper analyzes the influence of outside environment of the grounding conductor, including the interference source and the ground, on transient grounding resistance (TGR) under pulsed discharging current by using FDTD method. The results show that (1) TGR has bigger peak value and longer steady time when fast rising edge interference pulse acting on the grounding conductor than slow rising edge interference pulse; (2) when the layered soil is met, the grounding conductor should be buried in the soil which has bigger conductivity and not be in the neighboring of the layered boundary; (3) the locally improved soil has remarkable effect on the decrease of TGR, especially the expansion of the range of locally improved soil, but the influence of that on TGR is stepping down along the farther increasing of its conductivity when its range is fixed.
Keywords :
conductors (electric); earthing; electromagnetic interference; finite difference time-domain analysis; transients; FDTD method; edge interference pulse; grounding conductor; pulsed discharging current; soil improvement; transient grounding resistance; Conductivity; Conductors; Electromagnetic interference; Electromagnetic modeling; Electromagnetic transients; Finite difference methods; Grounding; Poles and towers; Soil; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2005. MAPE 2005. IEEE International Symposium on
Print_ISBN :
0-7803-9128-4
Type :
conf
DOI :
10.1109/MAPE.2005.1617974
Filename :
1617974
Link To Document :
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