• DocumentCode
    1640741
  • Title

    Issues in validating package compact thermal models for natural convection cooled electronic systems

  • Author

    Adams, V.H. ; Blackburn, D.L. ; Joshi, Y. ; Berning, D.W.

  • Author_Institution
    Dept. of Mech. Eng., Maryland Univ., College Park, MD, USA
  • fYear
    1997
  • Firstpage
    10
  • Lastpage
    23
  • Abstract
    A methodology is proposed for the validation of compact thermal models of electronic packages which utilizes data and simulations obtained from a simple but realistic system containing the package. The test system is the enclosure specified by the JEDEC Subcommittee, JC15.1 for thermal measurements in a natural convection environment. Simulations for a detailed model and several different compact models for a 88-pin plastic quad flat-package in the enclosure are in good agreement with experimental measurements of junction temperature. The study shows that the system must be well characterized, including accurate knowledge of circuit board thermal conductivity and accurate simulation of radiation heat transfer, to serve for validation purposes. For the package used in this study, system level considerations can outweigh package level considerations for predicting junction temperature. Given that the system is accurately modeled, the JEDEC enclosure can serve as a viable experimental validation tool for compact models
  • Keywords
    cooling; natural convection; plastic packaging; JEDEC enclosure; circuit board thermal conductivity; compact thermal model validation; electronic package; junction temperature; natural convection cooling; plastic quad flat-package; radiation heat transfer simulation; thermal measurement; Circuit simulation; Computational fluid dynamics; Computational modeling; Electronic packaging thermal management; Heat transfer; Predictive models; Semiconductor device packaging; Surface resistance; Temperature; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-3793-X
  • Type

    conf

  • DOI
    10.1109/STHERM.1997.566778
  • Filename
    566778