Title :
Signature analysis with non-linear feedback shift registers
Author :
Marinos, Peter N. ; Raina, Rajesh
Author_Institution :
Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
Abstract :
The use of nonlinear feedback shift registers (NLFSRs) in the design of signature analyzers (SAs) was investigated. It is shown that SAs with arbitrarily low values of error-escape probability and requiring less hardware than their linear feedback shift register (LFSR) counterparts are feasible and systematically realizable
Keywords :
feedback; logic analysers; logic design; probability; shift registers; data compression; error-escape probability; logic design; nonlinear feedback shift registers; signature analyzers; Circuit faults; Circuit testing; Hardware; Libraries; Linear feedback shift registers; Process design; Shift registers; Synthetic aperture sonar; Vectors;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82405
