• DocumentCode
    1641518
  • Title

    Dialectical non-supervised image classification

  • Author

    Dos Santos, Wellington P. ; De Assis, Francisco M. ; de Souza, Ricardo E. ; Mendes, Priscilla B. ; Monteiro, Henrique S S ; Alves, Havana D.

  • Author_Institution
    Dept. de Eng. Eletr., Univ. Fed. de Campina Grande, Campina Grande
  • fYear
    2009
  • Firstpage
    2480
  • Lastpage
    2487
  • Abstract
    The materialist dialectical method is a philosophical investigative method to analyze aspects of reality as complex processes composed by integrating units named poles. Dialectics has experienced considerable progress in the 19th century, with Hegel´s dialectics and, in the 20th century, with the works of Marx, Engels, and Gramsci, in philosophy and economics. The movement of poles through their contradictions is viewed as a dynamic process with intertwined phases of evolution and revolutionary crisis. Santos et al. introduced the objective dialectical classifier (ODC), a non-supervised self-organized map for classification. As a case study, we used ODC to classify 181 magnetic resonance synthetic multispectral images composed by proton density, T1- and T2-weighted synthetic brain images. Comparing ODC to k-means, fuzzy c-means, and Kohonen´s self-organized maps, concerning with image fidelity indexes as estimatives of quantization distortion, we proved that ODC can reach the same quantization performance as optimal non-supervised classifiers like Kohonen´s self-organized maps.
  • Keywords
    image classification; dialectical nonsupervised image classification; magnetic resonance synthetic multispectral image; materialist dialectical method; objective dialectical classifier; quantization distortion; Biological neural networks; Brain modeling; Computational intelligence; Computer networks; Image classification; Magnetic resonance; Multispectral imaging; Pattern recognition; Protons; Quantization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Evolutionary Computation, 2009. CEC '09. IEEE Congress on
  • Conference_Location
    Trondheim
  • Print_ISBN
    978-1-4244-2958-5
  • Electronic_ISBN
    978-1-4244-2959-2
  • Type

    conf

  • DOI
    10.1109/CEC.2009.4983252
  • Filename
    4983252