Synthetic testing of medium voltage load break switches

Author

Islam, Aminul ; Birtwhistle, D. ; Saha, Tapan K.

Author_Institution

Sch. of Inf. Technol. & Electr. Eng., Univ. of Queensland, Brisbane, QLD, Australia

fYear

2014

fDate

Sept. 28 2014-Oct. 1 2014

Firstpage

1

Lastpage

5

Abstract

This paper represents a multi-part switching test technique for testing Load Break Switches (LBS) using the basic synthetic test circuit (Weil circuit). In order to define the transient recovery voltage (TRV) due to LBS contact opening, a 4-parameter TRV envelope is proposed with an initial time delay parameter. A comparison between IEEE and IEC standard requirements has been made to compare the relative severity of TRV specified by the two standards. Simulation results revealed that it is possible to ensure both dielectric and thermal re-ignition withstand capability by using a two-part synthetic testing technique. Limitations with the method that result in excessive TRV are discussed.

Keywords

IEC standards; IEEE standards; delays; distribution networks; ignition; switches; switching circuits; 4-parameter TRV envelope; IEC standard requirements; IEEE standard requirements; LBS; Weil circuit; basic synthetic test circuit; dielectric re-ignition; medium voltage load break switches; multipart switching test; thermal re-ignition; time delay parameter; transient recovery voltage; two-part synthetic testing; Delay effects; Educational institutions; IEC standards; Reactive power; Switches; Testing; Transient analysis; Synthetic testing; TRV envelope; load break switch; transient recovery voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Engineering Conference (AUPEC), 2014 Australasian Universities

Conference_Location

Perth, WA

Type

conf

DOI

10.1109/AUPEC.2014.6966473

Filename

6966473