DocumentCode :
1642129
Title :
Enhancing power quality on distribution systems with Fault-Current Limiters
Author :
Escobar, A. ; Balda, J.C. ; Bourne, J. ; Barnes, A.K. ; Schupbach, R.M.
Author_Institution :
Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
fYear :
2012
Firstpage :
1
Lastpage :
5
Abstract :
High levels of power quality are required in electric power systems to ensure safe and continuous operation for most loads. Voltage sags, one of the most critical power quality problems that utilities and customers alike may face, are short voltage-reduction events representing probably one of the main causes of costly shutdowns in companies. Solid-State Fault Current Limiters (SSFCLs) have been proposed to reduce high short-circuit current levels as well as to minimize distributed generation contribution during faults. The focus of this paper is to quantify the power quality improvement in a distribution substation by placing strategically SSFCLs that not only act as protective devices reducing fault current magnitudes but also improve power quality on adjacent feeders by reducing voltage sag effects.
Keywords :
distributed power generation; electrical safety; fault current limiters; load (electric); power distribution faults; power distribution protection; power generation protection; power supply quality; short-circuit currents; substation protection; distributed generation; distribution substation; distribution system; electric load; electric power systems; operational safety; power generation faults; power quality enhancement; power quality improvement; protective devices; short voltage reduction events; short-circuit current level reduction; solid-state fault current limiters; voltage sag effect reduction; Circuit faults; Educational institutions; Fault currents; Power quality; Substations; Voltage fluctuations; Power quality; ride-through capability curves; solid-state fault current limiters; voltage sags;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Smart Grid Technologies (ISGT), 2012 IEEE PES
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4577-2158-8
Type :
conf
DOI :
10.1109/ISGT.2012.6175668
Filename :
6175668
Link To Document :
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