DocumentCode
1642330
Title
Integrated MEMS technology
Author
Ran, Cai ; Cai, Xue ; Jin, Fu ; Yu, Hu
Author_Institution
Coll. of Phys. Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2004
Firstpage
177
Lastpage
180
Abstract
For developing the integrated low-loss MEMS, the number of the optical-electrical micro-transducers must be arrayed to the optimum for controlling, high photoelectric conversion efficiency is also necessary, then the high rate data source will arrive at its destination with high signal-to-noise ratio (SNR), the optical micro-units (in micro-arrays) can be located to the maximum. To guarantee the reliability and the stability of running, the package technology is critical. The vector adaptive finding technology (VAF) with the segmented stage packaging technology (SSP) can satisfy the requirements. The extended vector adaptive finding (EVAF) can supply wireless services well, the simple vector adaptive finding (SVAF) is low-cost to implement.
Keywords
micromechanical devices; packaging; EVAF; MEMS technology integration; SVAF; data source; graininess measuring technology; integrated low-loss MEMS; low cost implementation; optical micro-units; optical-electrical micro-transducers; optimum arraying; photoelectric conversion efficiency; real-time processing; reliability; segmented stage packaging; signal-to-noise ratio; stability; vector adaptive finding; wireless services; High speed optical techniques; Integrated optics; Micromechanical devices; Optical arrays; Optical crosstalk; Optical sensors; Packaging; Signal to noise ratio; Stability; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
High Density Microsystem Design and Packaging and Component Failure Analysis, 2004. HDP '04. Proceeding of the Sixth IEEE CPMT Conference on
Print_ISBN
0-7803-8620-5
Type
conf
DOI
10.1109/HPD.2004.1346694
Filename
1346694
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