• DocumentCode
    1642330
  • Title

    Integrated MEMS technology

  • Author

    Ran, Cai ; Cai, Xue ; Jin, Fu ; Yu, Hu

  • Author_Institution
    Coll. of Phys. Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2004
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    For developing the integrated low-loss MEMS, the number of the optical-electrical micro-transducers must be arrayed to the optimum for controlling, high photoelectric conversion efficiency is also necessary, then the high rate data source will arrive at its destination with high signal-to-noise ratio (SNR), the optical micro-units (in micro-arrays) can be located to the maximum. To guarantee the reliability and the stability of running, the package technology is critical. The vector adaptive finding technology (VAF) with the segmented stage packaging technology (SSP) can satisfy the requirements. The extended vector adaptive finding (EVAF) can supply wireless services well, the simple vector adaptive finding (SVAF) is low-cost to implement.
  • Keywords
    micromechanical devices; packaging; EVAF; MEMS technology integration; SVAF; data source; graininess measuring technology; integrated low-loss MEMS; low cost implementation; optical micro-units; optical-electrical micro-transducers; optimum arraying; photoelectric conversion efficiency; real-time processing; reliability; segmented stage packaging; signal-to-noise ratio; stability; vector adaptive finding; wireless services; High speed optical techniques; Integrated optics; Micromechanical devices; Optical arrays; Optical crosstalk; Optical sensors; Packaging; Signal to noise ratio; Stability; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2004. HDP '04. Proceeding of the Sixth IEEE CPMT Conference on
  • Print_ISBN
    0-7803-8620-5
  • Type

    conf

  • DOI
    10.1109/HPD.2004.1346694
  • Filename
    1346694