• DocumentCode
    1642390
  • Title

    Use-dependent delay analysis of synchronous circuits

  • Author

    Sutton, Angela

  • Author_Institution
    Dept. of Electr. Eng., Aberdeen Univ., UK
  • fYear
    1989
  • Firstpage
    945
  • Abstract
    Exhaustive data-dependent simulation is expensive and can exercise impossible streams of transitions that could not occur during a circuit´s actual use. An investigation of the speed of a circuit may therefore find the slowest path to be one that could not occur in practice. In such a case, the estimate of the worst-case delay through the circuit would be pessimistic. A system is described which overcomes these problems by performing simulation in the context of a circuit´s intended use. The technique also facilitates much pruning of the simulation. The author describes a second and complementary technique that can prune the simulation further at the gate level without affecting the predicted delay and critical path of synchronous circuits. An application of these techniques to synchronous state machines is described
  • Keywords
    integrated circuit testing; integrated logic circuits; logic testing; circuit speed investigation; complementary technique; gate level; intended use of circuit; predicted delay; simulation pruning; slowest path; synchronous circuit path; synchronous circuits; synchronous state machines; use-dependent delay analysis; worst-case delay estimation; Circuit analysis; Circuit simulation; Context modeling; Data engineering; Delay estimation; Hazards; Logic circuits; Predictive models; State estimation; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1989., IEEE International Symposium on
  • Conference_Location
    Portland, OR
  • Type

    conf

  • DOI
    10.1109/ISCAS.1989.100507
  • Filename
    100507