• DocumentCode
    1642659
  • Title

    Electrostatic discharge (ESD) testing of semiconductor chips and systems - paradigm shifts, and semiconductor industry consequences

  • Author

    Voldman, Steven H.

  • Author_Institution
    ESD Assoc., Burlington, VT, USA
  • fYear
    2010
  • Firstpage
    54
  • Lastpage
    57
  • Abstract
    Dramatic changes and paradigm shifts are presently occurring in the area of electrostatic discharge (ESD) testing of semiconductor chips and systems which may have significant influence on the semiconductor industry. New semiconductor chip tests that have traditionally been regarded as system level events are now being proposed as requirements on semiconductor chips. As these changes are occurring, the consequences on the semiconductor industry, semiconductor chips, and systems are still to be understood in the future.
  • Keywords
    electrostatic discharge; semiconductor device testing; semiconductor industry; ESD testing; electrostatic discharge testing; paradigm shifts; semiconductor chip tests; semiconductor industry consequences; Discharges; Electromagnetic compatibility; Electrostatic discharge; Humans; Manufacturing; Standards; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-5797-7
  • Type

    conf

  • DOI
    10.1109/ICSICT.2010.5667853
  • Filename
    5667853