DocumentCode
1642659
Title
Electrostatic discharge (ESD) testing of semiconductor chips and systems - paradigm shifts, and semiconductor industry consequences
Author
Voldman, Steven H.
Author_Institution
ESD Assoc., Burlington, VT, USA
fYear
2010
Firstpage
54
Lastpage
57
Abstract
Dramatic changes and paradigm shifts are presently occurring in the area of electrostatic discharge (ESD) testing of semiconductor chips and systems which may have significant influence on the semiconductor industry. New semiconductor chip tests that have traditionally been regarded as system level events are now being proposed as requirements on semiconductor chips. As these changes are occurring, the consequences on the semiconductor industry, semiconductor chips, and systems are still to be understood in the future.
Keywords
electrostatic discharge; semiconductor device testing; semiconductor industry; ESD testing; electrostatic discharge testing; paradigm shifts; semiconductor chip tests; semiconductor industry consequences; Discharges; Electromagnetic compatibility; Electrostatic discharge; Humans; Manufacturing; Standards; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-5797-7
Type
conf
DOI
10.1109/ICSICT.2010.5667853
Filename
5667853
Link To Document