DocumentCode
1642754
Title
Electrical conductive characteristics of ACA bonding: a review of the literature, current challenges and future prospects
Author
Dou, Guangbin ; Whalley, David C. ; Liu, Changqing
Author_Institution
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., UK
fYear
2004
Firstpage
264
Lastpage
276
Abstract
Anisotropic conductive adhesives (ACAs) have been used in fine pitch electronics packaging for over a decade and provide a high density and low temperature bonding method in a range of niche applications. The principal objective of this paper is to provide significant insights into the basic conductive characteristics of ACAs based on a review of previously reported scientific research, and to identify the current challenges and future prospects for this technology. In order to provide a concise, structured overview of this topic, many detailed conductive models, mathematical solutions and research methodologies are presented based on the reviewed literature. These models can partially explain the conductive mechanisms of an ACA particle, but make a number of important simplifying assumptions. However, one model was developed and can be used to explain the conductive mechanism of an ACA particle more successfully. In conclusion, existing computational models, mathematical models and physical models have been used to estimate the resistance of an ACA particle and the particle contact area, and therefore constriction resistance, for a given degree of particle deformation, thereby almost achieving a model for the whole resistance of an ACA joint. The paper will close by identifying other research challenges remaining for this important electronics interconnection technology.
Keywords
adhesives; electric resistance; electrical conductivity; integrated circuit bonding; integrated circuit interconnections; ACA bonding; ACA particle; anisotropic conductive adhesives; computational models; conductive mechanism; constriction resistance; electrical conductive characteristics; electronics interconnection technology; fine pitch electronics packaging; mathematical models; particle contact area; particle deformation; physical models; Anisotropic magnetoresistance; Bonding; Computational modeling; Conductive adhesives; Contact resistance; Deformable models; Electronics packaging; Mathematical model; Physics computing; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
High Density Microsystem Design and Packaging and Component Failure Analysis, 2004. HDP '04. Proceeding of the Sixth IEEE CPMT Conference on
Print_ISBN
0-7803-8620-5
Type
conf
DOI
10.1109/HPD.2004.1346710
Filename
1346710
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