• DocumentCode
    1643103
  • Title

    Predictive BSIM3v3 modeling for the 0.15-0.18 /spl mu/m CMOS technology node: a process DOE based approach

  • Author

    Vasanth, K. ; Krick, J. ; Unnikrishnan, S. ; Nandakumar, M. ; Jacobs, J. ; Ehnis, P. ; Green, K. ; Machala, C. ; Vrotsos, T.

  • Author_Institution
    Spice Modeling Lab., Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1999
  • Firstpage
    353
  • Lastpage
    356
  • Abstract
    An efficient and accurate approach using the BSIM3v3 compact model to support concurrent process technology development and circuit design is presented. The key feature is the ability to generate accurate pre-silicon BSIM3 models for new technologies taking into account process information from existing technologies. Device, circuit and process optimization results are presented.
  • Keywords
    CMOS integrated circuits; design of experiments; integrated circuit technology; semiconductor process modelling; 0.15 to 0.18 micron; BSIM3v3 model; CMOS technology; circuit design; design of experiments; process optimization; CMOS process; CMOS technology; Calibration; Circuit simulation; Data mining; Parameter extraction; Predictive models; Semiconductor device modeling; Space technology; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-5410-9
  • Type

    conf

  • DOI
    10.1109/IEDM.1999.824168
  • Filename
    824168