Title :
Research on ESD interference effect on interface circuit of microcomputer
Author :
Yuan, Qing-yun ; Zhan-cheng Wu ; Song, Wen-wu
Author_Institution :
Electrostatic & Electromagn. Protection Res. Inst., Shijiazhuang Mech. Eng., China
Abstract :
In this paper, a typical single-chip circuit is designed to simulate serial communication interface in order to study the effect of ESD EMP. Using the ESD generator, the radiation effect experiments of ESD on the single chip microprocessor (SCM) system have been carried out. By analyzing the experiment data, some rules of the typical serial communication circuit under ESD are presented.
Keywords :
electromagnetic interference; electromagnetic pulse; electrostatic discharge; microcomputers; microprocessor chips; peripheral interfaces; EMP; ESD interference effect; SCM system; electromagnetic pulse; electrostatic discharge; microcomputer; serial communication interface circuit; single chip microprocessor; Cable shielding; Circuit simulation; Communication cables; Displays; Electromagnetic interference; Electrostatic discharge; Electrostatic interference; Microcomputers; Protection; Voltage;
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2005. MAPE 2005. IEEE International Symposium on
Print_ISBN :
0-7803-9128-4
DOI :
10.1109/MAPE.2005.1618074
