• DocumentCode
    1643406
  • Title

    Comparison of fractal dimension estimation algorithms for epileptic seizure onset detection

  • Author

    Polychronaki, Georgia E. ; Ktonas, Periklis ; Gatzonis, Stylianos ; Asvestas, Pantelis A. ; Spanou, Eirini ; Siatouni, Anna ; Tsekou, Hara ; Sakas, Damianos ; Nikita, Konstantina S.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The fractal dimension (FD) is a natural measure of the irregularity of a curve. In this study the performances of two FD-based methodologies are compared in terms of their ability to detect the onset of epileptic seizures in scalp EEG. The FD algorithms used is Katzpsilas, which has been broadly utilized in the EEG analysis literature, and the k-nearest neighbor (k-NN), which is applied in this study in a time series sense for the first time. 244.9 hours of EEG recordings, including 16 seizures in 3 patients, were analyzed. Both approaches achieved 100% sensitivity with a false positive rate of 0.85 FP/h for the k-NN algorithm and 1 FP/h for Katzpsilas algorithm. The corresponding detection delays were 6.5 s and 10.5 s on the average, respectively. The k-NN algorithm seems to outperform Katzpsilas algorithm. Results are satisfactory in comparison to other methodologies applied on scalp EEG and proposed in the literature.
  • Keywords
    bioelectric phenomena; electroencephalography; fractals; medical disorders; medical signal detection; neurophysiology; time series; curve irregularity; epileptic seizure onset detection; fractal dimension estimation algorithm; k-NN algorithm; k-nearest neighbor; scalp EEG recording; time 244.9 h; time series; Algorithm design and analysis; Educational technology; Electroencephalography; Epilepsy; Fractals; Hospitals; Monitoring; Neurosurgery; Scalp; Time series analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    BioInformatics and BioEngineering, 2008. BIBE 2008. 8th IEEE International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4244-2844-1
  • Electronic_ISBN
    978-1-4244-2845-8
  • Type

    conf

  • DOI
    10.1109/BIBE.2008.4696822
  • Filename
    4696822