• DocumentCode
    1643474
  • Title

    Thermal analysis of a chip on board (COB)

  • Author

    De Moerloose, J. ; Temmerman, W.

  • Author_Institution
    Alcatel Telecom, Antwerp, Belgium
  • fYear
    1997
  • Firstpage
    112
  • Lastpage
    118
  • Abstract
    While solving many of today´s chip interconnection problems, MCM technology presents major challenges with respect to thermal compatibility. The high power dissipation on a very limited area in many cases forces additional cooling measures such as thermal vias and heat sinks. Whether such measures should be applied or not and, if so, where to apply them, are just some of the questions that have to be answered in the design process. Fortunately, new tools are coming to the aid of the designer. Current CFD software has evolved in such a way that a detailed simulation of a single chip on the scale of a module is no longer beyond our reach. In this paper we present a set of simulations (using the CFD software FLOTHERM) that were performed on a typical chip-on-board implementation of a clock function for a broadband fine-board. Junction temperatures are calculated for different types of heat sinks. In the second part of the paper, some experiments on a thermal test module are described and the thermal resistance of each chip was determined for different MCM-L thermal technologies
  • Keywords
    clocks; cooling; heat sinks; multichip modules; thermal analysis; thermal resistance; CFD software; COB; FLOTHER; MCM-L; broadband fine-board; chip on board; clock function; cooling; design; heat sink; junction temperature; power dissipation; simulation; thermal analysis; thermal resistance; thermal via; Area measurement; Computational fluid dynamics; Cooling; Force measurement; Heat sinks; Power dissipation; Power measurement; Semiconductor device measurement; Thermal force; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-3793-X
  • Type

    conf

  • DOI
    10.1109/STHERM.1997.566788
  • Filename
    566788