• DocumentCode
    16435
  • Title

    High-Bandwidth AFM Probes for Imaging in Air and Fluid

  • Author

    Vijayraghavan, Karun ; Gellineau, A.A. ; Wang, Aiping ; Butte, Manish J. ; Melosh, Nicholas A. ; Solgaard, Olav

  • Author_Institution
    Edward L. Ginzton Labs., Stanford Univ., Stanford, CA, USA
  • Volume
    22
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    603
  • Lastpage
    612
  • Abstract
    Due to the high mechanical bandwidth of an integrated diffraction-grating-based force sensor, interdigitated AFM probes enable probing the nanomechanical properties of the sample by measuring fast varying tip-sample interaction forces while operating in tapping mode. To explain the mechanical frequency response obtained from finite-element analysis, we developed an analytical model that incorporates the higher order flexural modes of a cantilever. To enable flexibility necessary to use the probes in different imaging environments, a step is introduced into the batch fabrication where high-stress nitride is used. This step allows the probe to be used in various optical conditions such as different laser wavelengths (in the light-lever configuration), incident angles, and ambient refractive indices (such as air and water). We demonstrate that the probe can operate in both air and fluid and measure fast varying tip-sample interactions by imaging a sputtered gold film in both conditions.
  • Keywords
    atomic force microscopy; cantilevers; diffraction gratings; finite element analysis; force sensors; gold; refractive index; Au; air imaging; ambient refractive indices; cantilever; finite-element analysis; fluid imaging; high mechanical bandwidth; high-bandwidth AFM probes; high-stress nitride; higher order flexural modes; incident angles; integrated diffraction-grating-based force sensor; laser wavelengths; mechanical frequency response; nanomechanical properties; sputtered gold film; Analytical models; Fabrication; Force; Frequency response; Imaging; Probes; Resonant frequency; Atomic force microscopy (AFM); diffraction; force measurement; gratings; imaging; optical interferometry;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2012.2235822
  • Filename
    6415233