• DocumentCode
    1643500
  • Title

    Interpretation of the depolarizing effects in vector diffraction tomography

  • Author

    Soliman, Nabil A. ; Boerner, Wolfgang M.

  • Author_Institution
    Illinois Univ., Chicago, IL, USA
  • fYear
    1989
  • Firstpage
    1012
  • Abstract
    The major difficulty in evaluating possible practical applications of vector diffraction tomography is that experimental data are still sparse and that the data generated usually involve either the Born or Ryton scalar wave approximations. In order to test the depolarizing effects in electromagnetic wave equation needs to be inverted, which at the current state of the art still cannot be done. Instead, for the inverse problem of image formation, oblique incidence on a circular cylindrical scatterer is investigated. It is shown that reconstructions of the exact fields at oblique incidence deteriorate rapidly as the angle of incidence deviates further from normal incidence, due to depolarizing effects. These reconstructions are investigated, and, in addition, it is shown that apparent depolarization of the incident field increases as one approaches the object due to near field effects. The results of these numerical simulations indicate that even a small degree of depolarization strongly affects the quality of the image reconstruction. Therefore, it is concluded that the depolarizing term of the wave equation cannot be neglected in microwave (vector) diffraction tomography
  • Keywords
    computerised tomography; microwave measurement; Born scalar wave approximations; Ryton scalar wave approximations; angle of incidence; circular cylindrical scatterer; depolarizing effects; electromagnetic wave equation; experimental data; image degradation; image reconstruction; inverse problem of image formation; microwave diffraction tomography; near field effects; numerical simulations; oblique incidence; vector diffraction tomography; Image reconstruction; Inverse problems; Optical diffraction; Optical scattering; Partial differential equations; Permittivity; Shape measurement; Tomography; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1989., IEEE International Symposium on
  • Conference_Location
    Portland, OR
  • Type

    conf

  • DOI
    10.1109/ISCAS.1989.100523
  • Filename
    100523