Title :
The advanced test system architecture provides fast and accurate test for a high resolution ADC
Abstract :
This work describes the new approach to test the linearity of the high resolution ADCs using the test system which has the advanced architecture. The enhanced linear histogram method is implemented and the very accurate results is obtained. Also the test time is almost half of the ordinary histogram method.
Keywords :
Clocks; Delay; Digital signal processing; Histograms; Linearity; Master-slave; Signal generators; Signal resolution; Synchronization; System testing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527805
