Title :
Practical applications of nonlinear measurements
Author_Institution :
Electromagn. Div., NIST, Boulder, CO, USA
Abstract :
We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.
Keywords :
calibration; electric variables measurement; network analysers; VNA; actual impedance; calibration; frequency components; measurement instruments; nonlinear circuits; nonlinear measurements; vector network analyzer; Calibration; Frequency; IEC standards; ISO standards; Laboratories; Mathematics; Metrology; Scattering parameters; Software tools; Testing; Linear measurements; Measurement-based model; Nonlinear measurements; Nonlinear vector network analyzer; Vector network analyzer;
Conference_Titel :
Microwave Measurement Conference, 2009 73rd ARFTG
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3442-8
Electronic_ISBN :
978-1-4244-3443-5
DOI :
10.1109/ARFTG.2009.5278060
