Abstract :
The following topics are dealt with: nonlinear measurements; wave distortion; mixers; time domain large signal measurement; mixed-signal approach; high-speed fully controlled multidimensional load-pull parameters sweep; pulsed multi-tone measurements; time domain load pull characterizations; power transistors; fast component characterization; smart modulation signals; manufacturing test; nonlinear validation; load x-parameter; measurement-based device models; calibration comparison; transmission line standards; microwave power amplifier; TRL; LRM; S-parameters; network analyzer time domain; permittivity measurements; dielectric substrates; and waveguide devices.
Keywords :
S-parameters; calibration; microwave power amplifiers; mixers (circuits); multidimensional signal processing; permittivity measurement; power transistors; time-domain analysis; transmission lines; LRM; S-parameters; TRL; calibration comparison; dielectric substrates; fast component characterization; high-speed fully controlled multidimensional load pull parameters sweep; load x-parameter; manufacturing test; measurement-based device models; microwave power amplifier; mixed-signal approach; mixers; network analyzer time domain; nonlinear measurement; nonlinear validation; permittivity measurements; power transistors; pulsed multitone measurement; smart modulation signals; time domain large signal measurement; time domain load pull characterizations; transmission line standards; wave distortion; waveguide devices;
Conference_Titel :
Microwave Measurement Conference, 2009 73rd ARFTG
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3442-8
DOI :
10.1109/ARFTG.2009.5278061
