DocumentCode :
1644449
Title :
Improved ultraviolet quantum efficiency using a transparent recessed window AlGaN/GaN heterojunction p-i-n photodiode
Author :
Carrarro, J.C. ; Li, T. ; Beck, A.L. ; Collins, C. ; Dupuis, R.D. ; Campbell, J.C. ; Schurman, M.J. ; Ferguson, I.A.
Author_Institution :
Photonics Res. Center, United States Mil. Acad., West Point, NY, USA
fYear :
1999
Firstpage :
587
Lastpage :
590
Abstract :
High quantum efficiency ultraviolet p-i-n heterojunction photodiodes, fabricated on single crystal AlGaN/GaN, were characterized including spectral responsivity, dark current, and speed. At a reverse bias of -5 V the quantum efficiency was /spl sim/57 % at the band edge, and remained relatively flat down to /spl sim/330 nm after which some absorption in the p-AlGaN layer became evident. We attribute these results to avoidance of the optical dead space at the surface of GaN homojunction p-i-n´s. The transparent p-AlGaN layer was comparatively resistive, causing an electric field crowding effect which resulted in a spatially non-uniform temporal behavior.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; p-i-n photodiodes; transparency; ultraviolet detectors; wide band gap semiconductors; -5 V; 280 to 380 nm; 57 percent; AlGaN-GaN; GaN homojunction p-i-n photodiode; UV quantum efficiency; band edge; dark current; electric field crowding effect; high quantum efficiency; optical dead space; p-AlGaN layer absorption; reverse bias; spatially nonuniform temporal behavior; spectral responsivity; speed; transparent p-AlGaN layer; transparent recessed window AlGaN/GaN heterojunction p-i-n photodiode; ultraviolet p-i-n heterojunction photodiodes; Aluminum gallium nitride; Dark current; Electromagnetic wave absorption; Gallium nitride; Heterojunctions; High speed optical techniques; Optical surface waves; PIN photodiodes; Quantum mechanics; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5410-9
Type :
conf
DOI :
10.1109/IEDM.1999.824222
Filename :
824222
Link To Document :
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