Title :
Modeling a micro-spectrometer for numerical correction of its metrological parameters
Author :
Wisniewski, Michal P. ; Morawski, Roman Z. ; Barwicz, Andrzej
Author_Institution :
Dept. of Electr. Eng., Quebec Univ., Trois-Rivieres, Que., Canada
Abstract :
Numerical correction of spectrograms is based on the use of mathematical models of the relationship between a measured spectrum and the output of a spectrometer used for measurements. In this paper, a method for mathematical modeling of the microspectrometer is proposed and discussed. This method is based on decomposition of the spectrometer into functional blocks and on black-box modeling of those blocks. The input-output model of the spectrometer is obtained by combining the mathematical models of its functional blocks. An example of modeling of the micro-spectrometer SD1000 (by Ocean Optics) is given. The superiority of the obtained nonlinear model over a linear one is demonstrated
Keywords :
measurement errors; modelling; signal processing; visible spectrometers; visible spectroscopy; black-box modeling; decomposition; functional blocks; input-output model; metrological parameters; micro-spectrometer; numerical correction; Light sources; Mathematical model; Nonlinear optics; Oceans; Optical fibers; Optical signal processing; Sea measurements; Spectrogram; Spectroscopy; Wavelength measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.604014
