• DocumentCode
    1644528
  • Title

    Traceability chart for vector network analyzers from 70 kHz to 70 GHz

  • Author

    Lee, Yeou-Song

  • Author_Institution
    Dept. of Quality, Anritsu Co., Morgan Hill, CA, USA
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Metrological traceability is defined as the property of a measurement result whereby the result can be related to a reference through a documented unbroken chain of calibrations, each contributing to the measurement uncertainty. A reference is a measurement unit including its practical realization. Unsupported air dielectric coaxial transmission lines (or air lines) have been used as primary reference standards for impedance measurements at RF and microwave frequencies. Multi-line Line-reflect-line (LRL) calibration kits are used to achieve the very highest levels of accuracy required by metrology labs. By analyzing the measurement risks from different VNA calibration schemes, users can demonstrate the adequacy of uncertainty budgets, which is a requirement for mitigation of measurement risk and demonstration of traceability. A comparison of automatic calibration vs. LRL will be used as the case study for measurement risk.
  • Keywords
    calibration; coaxial cables; electric impedance measurement; measurement uncertainty; millimetre wave devices; network analysers; radiofrequency measurement; transmission lines; coaxial transmission lines; frequency 70 kHz to 70 GHz; impedance measurements; measurement risk; measurement uncertainty; metrological traceability; multiline line-reflect-line calibration kits; traceability chart; unsupported air dielectric; vector network analyzers; Calibration; Coaxial components; Dielectric measurements; Impedance measurement; Measurement standards; Measurement uncertainty; Measurement units; Microwave frequencies; Radio frequency; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference, 2009 73rd ARFTG
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-3442-8
  • Electronic_ISBN
    978-1-4244-3443-5
  • Type

    conf

  • DOI
    10.1109/ARFTG.2009.5278065
  • Filename
    5278065