Title :
A method for estimating the complex residual errors of a VNA in one-port measurements
Author :
Kim, Jeong-Hwan ; Kang, Jin-Seob ; Kim, Dae-Chan
Author_Institution :
Center for Electromagn. Wave, Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea
Abstract :
This paper presents a method using multiple air lines for estimating the complex residual errors of a VNA (vector network analyzer) being calibrated by an dasiaOSLpsila (open-short-load) technique, which is widely used for one-port measurements. It uses a simple circle fit algorithm, together with some techniques to be used for improving the accuracy in finding the center and radius of a circle in the complex (reflection coefficient) plane from measured calibration data.
Keywords :
calibration; measurement errors; microwave measurement; network analysers; reflection; complex residual error estimation; measured calibration data; multiple air lines; one-port measurements; open-short-load; reflection coefficient; simple circle fit algorithm; vector network analyzer; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Frequency measurement; Loss measurement; Magnetic field measurement; NIST; Permittivity measurement; Resonance; Tellurium;
Conference_Titel :
Microwave Measurement Conference, 2009 73rd ARFTG
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3442-8
Electronic_ISBN :
978-1-4244-3443-5
DOI :
10.1109/ARFTG.2009.5278068
