Detection of High Impedance Faults using wavelet transform

Author

Chen, J.C. ; Phung, B.T. ; Wu, H.W. ; Zhang, D.M. ; Blackburn, T.

Author_Institution

Sch. of Electr. Eng. & Telecommun., Univ. of New South Wales, Sydney, NSW, Australia

fYear

2014

fDate

Sept. 28 2014-Oct. 1 2014

Firstpage

1

Lastpage

6

Abstract

High Impedance Fault (HIF) has long been a challenging problem in network protection. This is because of its difficulty to be detected and discriminated accurately and reliably. In real cases, arcing is usually associated with HIFs. In this paper, arcing currents are produced by setting up a HV experiment. Normal switching transients are also produced by simulation or experiment. They are then analysed based on wavelet transform. It was found by previous researches that db4 is sensitive in detecting high frequency transient. Different features for the fault currents are found and a detection criterion is developed. The simple detection criterion is used to discriminate the high impedance fault from switching transients and normal load current.

Keywords

arcs (electric); electric impedance; fault diagnosis; wavelet transforms; HIF detection; arcing currents; fault currents; high frequency transient; high impedance fault detection; network protection; normal load current; normal switching transients; wavelet transform; Educational institutions; Fault currents; Impedance; Switches; Transient analysis; Wavelet transforms; High impedance fault; arcing; capacitor switching; magnetizing inrush; wavelet transform;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Engineering Conference (AUPEC), 2014 Australasian Universities

Conference_Location

Perth, WA

Type

conf

DOI

10.1109/AUPEC.2014.6966629

Filename

6966629