• DocumentCode
    1644634
  • Title

    Inter-hierarchical power analysis methodology to reduce multiple orders of magnitude run-time without compromizing accuracy

  • Author

    Nan, Haiqing ; Choi, Ken

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2009
  • Firstpage
    556
  • Lastpage
    559
  • Abstract
    Now, it is very common to require more than ten engineering-change-order (ECO) iterations to sign-off VLSI design in scaled technologies because engineers should close not only circuit speed, but also power. One of the main components of the long turn-around-time for closing power is generating activity files at gate level or at register-transfer-level (RTL) to analyze the power. This paper describes a method to reduce the power-analysis run time multiple orders of magnitude maintaining gate-level power-analysis accuracy. To reduce the run-time dramatically for power analysis, novel activity-propagation and port-mapping algorithms to convert automatically from electronic-system-level (ESL) activity file to RTL vcd (value change dump) file and to gate-level vcd file have been proposed. After obtaining all vcd files in each level, we can do power analysis without accuracy degradation at RTL and at gate level. In this method, a huge amount of run time for simulation in each level is reduced. By analyzing a variety of digital circuits, we demonstrate the run-time of our methodology is an order of magnitude faster than traditional method at RTL and multiple orders of magnitude faster at gate level with less than 1% accuracy degradation of RTL and gate-level power analysis.
  • Keywords
    integrated circuit design; logic design; VLSI design; activity propagation algorithm; digital circuits; electronic system level activity; gate level power analysis accuracy; inter-hierarchical power analysis methodology; port mapping algorithm; register transfer level; value change dump file; Algorithm design and analysis; Circuits; Computational modeling; Degradation; Design engineering; Humans; Personal digital assistants; Power engineering and energy; Runtime; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference (ISOCC), 2009 International
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-5034-3
  • Electronic_ISBN
    978-1-4244-5035-0
  • Type

    conf

  • DOI
    10.1109/SOCDC.2009.5423822
  • Filename
    5423822