Title :
Large-signal modeling of SiGe HBT for PA applications
Author :
Lee, Tzung-Yin ; Lee, Sunyoung ; Zampardi, Pete ; Kang, Jongchan
Author_Institution :
Skyworks Solutions, Inc., Irvine, CA, USA
Abstract :
Accurate modeling of large-signal behavior of power amplifiers (PAs) is key in minimizing the number of design spins and design cycle time. This paper presents the 1- and 2-tone large-signal behavior of SiGe HBT with respect to power, frequency, bias, and transistor geometry. While the transistor´s weak non-linearity is largely determined by the trans-conductance (Gm) and the quasi-static (QS) charge-storage of the transistor, its high-power large-signal behavior heavily depends on the high-current gain roll-off characteristics and supply clamping. It is discussed from a PA-design standpoint how the SiGe bandgap engineering impacts the large-signal behavior through a steeper gain compression at high currents and high power levels. It is also shown that the 2-tone inter-modulation products of a transistor are closely related to its 1-tone distortion characteristics. Finally an accurate prediction of critical parameters of a practical WCDMA PA was demonstrated with careful accounting of the high-current effects in the SiGe HBT transistor.
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; integrated circuit design; power amplifiers; HBT; PA applications; gain compression; large-signal modeling; power amplifiers; Heterojunction bipolar transistors; Integrated circuit modeling; Multiaccess communication; Predictive models; Radio frequency; Silicon germanium; PA design; RF circuit design; SiGe HBT modeling; large-signal modeling;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-8578-9
DOI :
10.1109/BIPOL.2010.5667936