Title :
Non-linear effects and the use of network analyzer time domain
Author_Institution :
Anritsu Co., Morgan Hill, CA, USA
Abstract :
While normally considered a tool for evaluating passive networks, vector network analyzer time domain can sometimes be of interest for active and semi-linear device analysis. The identification of sequential match compression in a multi-stage structure and the analysis of bias network-related delay anomalies are among the diagnostics available. The approach is not without its hazards, however, as defect shielding effects become more complicated and the VNA´s own compression behavior can be critical. The effects of these behaviors will be analyzed semi-quantitatively and a number of example measurements will be presented.
Keywords :
S-parameters; active networks; microwave devices; microwave measurement; network analysers; nonlinear network analysis; time-domain analysis; Scattering parameters measurement; active device analysis; bias network related delay; microwave measurements; multistage structure; non linear effect; nonlinear distortion; semilinear device analysis; sequential match compression; time domain measurements; time domain reflectometry; vector network analyzer time domain; Distortion measurement; Frequency; Hazards; Microwave measurements; Nonlinear distortion; Passive networks; Reflection; Scattering parameters; Time domain analysis; Time measurement; Microwave measurements; Nonlinear distortion; Scattering parameters measurement; Time domain measurements; Time domain reflectometry;
Conference_Titel :
Microwave Measurement Conference, 2009 73rd ARFTG
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3442-8
Electronic_ISBN :
978-1-4244-3443-5
DOI :
10.1109/ARFTG.2009.5278075