Title :
A general purpose microwave power amplifier characterization setup and its phase calibration
Author :
Shen, Yilong ; Gajadharsing, John ; Tauritz, J.
Author_Institution :
RF Power & Basestation, NXP Semicond., Nijmegen, Netherlands
Abstract :
A test setup similar in working principle to that of a commercial VSG&VSA combination is presented for the dynamic characterization of microwave power amplifiers (PAs). Features and performance of the setup are discussed. The paper also considers calibration of the phase measurement of such time domain systems based on the concept of nonlinear phase distortion.
Keywords :
calibration; distortion measurement; microwave measurement; microwave power amplifiers; time-domain analysis; VSG&VSA combination; dynamic characterization; general purpose microwave power amplifier; nonlinear phase distortion; phase measurement calibration; time domain systems; Calibration; Distortion measurement; Frequency; Microwave amplifiers; Performance evaluation; Phase distortion; Phase measurement; Power amplifiers; Radiofrequency amplifiers; Testing; Calibration; demodulation; nonlinear distortion; phase distortion; phase measurement; power amplifiers; time domain measurements;
Conference_Titel :
Microwave Measurement Conference, 2009 73rd ARFTG
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3442-8
Electronic_ISBN :
978-1-4244-3443-5
DOI :
10.1109/ARFTG.2009.5278077
