DocumentCode :
1644991
Title :
Design of a high precision band-gap reference with piecewise-linear compensation
Author :
Quan, Lei ; Yin, Yongsheng ; Yang, Xinbo ; Deng, Honghui
Author_Institution :
Inst. of VLSI Design, Hefei Univ. of Technol., Hefei, China
fYear :
2012
Firstpage :
1
Lastpage :
5
Abstract :
A high precision band-gap reference (BGR) with piecewise-linear compensation is designed in this paper. A low voltage Brokaw BGR architecture is employed to provide low output voltage. A high gain, low power supply rejection ratio (PSRR) operational amplifier is designed to improve the PSRR of the band-gap reference. In order to achieve temperature stability significantly lower than the traditional band-gap reference, a circuit which produces a current with positive temperature coefficient (TC) at high temperatures and 0 current at lower temperatures is designed. The whole BGR circuits are simulated by Spectre based on chartered 0.18μm 1P5M 1.8V CMOS technology. It´s clear from simulation result that the TC of the output reference voltage approaches 2.61ppm/K over the military temperature range, the PSRR reaches 107.2dB at low frequency (f=0.1HZ), the whole BGR dissipates 0.4mW. In addition, the output reference voltage changes only 8.6μV when the power supply changes from 1.5V to 2.1V, that is to say, the power regulation ratio is 0.014mV/V.
Keywords :
operational amplifiers; power supply circuits; Brokaw BGR architecture; CMOS technology; PSRR; Spectre; high precision bandgap reference; military temperature range; operational amplifier; output reference voltage; piecewise linear compensation; positive temperature coefficient; power regulation ratio; power supply rejection ratio; temperature stability; CMOS integrated circuits; Low voltage; Operational amplifiers; Photonic band gap; Power supplies; Temperature distribution; band-gap reference; piecewise-linear compensation; power supply rejection ratio; temperature coefficient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Anti-Counterfeiting, Security and Identification (ASID), 2012 International Conference on
Conference_Location :
Taipei
ISSN :
2163-5048
Print_ISBN :
978-1-4673-2144-0
Electronic_ISBN :
2163-5048
Type :
conf
DOI :
10.1109/ICASID.2012.6325338
Filename :
6325338
Link To Document :
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