• DocumentCode
    1645013
  • Title

    Second-order error correction of a calibrated two-port vector network analyzer

  • Author

    Judaschke, Rolf ; Wübbeler, Gerd ; Elster, Clemens

  • Author_Institution
    Phys.-Tech. Bundesanstalt, Braunschweig, Germany
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A technique for second-order correction of the system error parameters of a calibrated two-port vector network analyzer (VNA) is described. The method is based on the determination of the complex-valued residual directivity, source match, and reflection tracking by one single reflection measurement at both ports employing a high precision airline terminated by a short. From one additional measurement of the through connection applying partly corrected system error parameters, the second-order corrected transmission tracking and the load match in both directions are calculated. Thus, a complete set of second-order corrected error model parameters is determined resulting in an accuracy enhancement. Furthermore, the differences between first- and second-order error parameters give a measure for the quality of the VNA calibration performed beforehand. Measurement results for a 10-dB attenuator are given and compared with data resulting from reference attenuation measurements.
  • Keywords
    attenuation measurement; calibration; network analysers; VNA calibration; attenuator; complex-valued residual directivity; reference attenuation measurements; reflection tracking; second-order corrected error model; second-order corrected transmission tracking; second-order error correction; single reflection measurement; source match; two-port vector network analyzer; Attenuation measurement; Calibration; Data mining; Error correction; Frequency estimation; Frequency measurement; Measurement standards; Measurement uncertainty; Performance evaluation; Reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference, 2009 73rd ARFTG
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-3442-8
  • Electronic_ISBN
    978-1-4244-3443-5
  • Type

    conf

  • DOI
    10.1109/ARFTG.2009.5278080
  • Filename
    5278080