Title :
IS IEEE 1149.1 BOUNDARY SCAN COST EFFECTIVE: A SIMPLE CASE STUDY
Author :
Caldwell, Barry ; Langford, Tom
Keywords :
Assembly; Chip scale packaging; Circuit testing; Computer aided software engineering; Costs; Job shop scheduling; Manufacturing; Principal component analysis; Printed circuits; System testing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527810
