• DocumentCode
    1645199
  • Title

    Performance comparison of 5GHz VCOs integrated by CMOS compatible high Q MEMS inductors

  • Author

    Eun-Chul Park ; Sang-Hyun Baek ; Taek-Sang Song ; Jun-Bo Yoon ; Euisik Yoon

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • Volume
    2
  • fYear
    2003
  • Firstpage
    721
  • Abstract
    In this paper, we report the performance comparison of 5 GHz CMOS VCOs fabricated by 0.18 /spl mu/m six-metal mixed-mode RF CMOS processes with respect to the same VCOs integrated with high Q MEMS inductors. The CMOS inductors implemented by a top-level 2 /spl mu/m-thick Al/Cu metal layer typically show Q factors of about 10, while the MEMS inductors can give much higher Q factors over 25. Differential CMOS VCO circuits have been optimally designed for the respective Q factors of both CMOS and MEMS inductors. Phase noise has been measured and compared for the fabricated VCOs, demonstrating that the VCOs with MEMS inductors can give better phase noise by more than 7 dB in the offset frequency range from 30 kHz to 3 MHz.
  • Keywords
    CMOS integrated circuits; MMIC oscillators; inductors; integrated circuit design; integrated circuit measurement; integrated circuit metallisation; integrated circuit noise; micromachining; micromechanical devices; phase noise; voltage-controlled oscillators; 0.18 micron; 2 micron; 5 GHz; Al-Cu; Al/Cu metal layers; CMOS compatible high Q MEMS inductors; differential CMOS VCO; microwave VCO performance comparison; mixed-mode RF CMOS processes; offset frequency range phase noise; surface micromachining processes; suspended MEMS inductors; voltage controlled oscillators; CMOS process; Circuits; Frequency measurement; Inductors; Micromechanical devices; Noise measurement; Phase noise; Q factor; Radio frequency; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1212473
  • Filename
    1212473