Title :
Bayesian face recognition with deformable image models
Author :
Moghaddam, Baback ; Nastar, Vhahab ; Pentland, Alex
Author_Institution :
Mitsubishi Electr. Res. Lab., Cambridge, MA, USA
Abstract :
We propose a novel representation for characterizing image differences using a deformable technique for obtaining pixel-wise correspondences. This representation, which is based on a deformable 3D mesh in XYI-space, is then experimentally compared with two related correspondence methods: optical flow and intensity differences. Furthermore, we make use of a probabilistic similarity measure for direct image matching based on a Bayesian analysis of image variations. We model two classes of variation in facial appearance: intra-personal and extra-personal. The probability density function for each class is estimated from training data and used to compute a similarity measure based on the a posteriori probabilities. The performance advantage of our deformable probabilistic matching technique is demonstrated using 1700 faces from the USA Army´s “FERET” face database
Keywords :
Bayes methods; face recognition; image matching; image representation; image sequences; probability; 3D mesh; Bayesian analysis; XYI space; a posteriori probabilities; correspondence methods; deformable image models; direct image matching; extra-personal variation; face recognition; facial appearance; image differences; image representation; image variations; intensity differences; intra-personal variation; optical flow; performance; pixel-wise correspondences; probabilistic similarity measure; probability density function; Bayesian methods; Deformable models; Density measurement; Face recognition; Image analysis; Image matching; Image motion analysis; Pixel; Probability density function; Training data;
Conference_Titel :
Image Analysis and Processing, 2001. Proceedings. 11th International Conference on
Conference_Location :
Palermo
Print_ISBN :
0-7695-1183-X
DOI :
10.1109/ICIAP.2001.956981