Title :
Optimized BIST Strategies for Programmable Data Paths Based on Cellular Automata
Author :
vanSas, J. ; Catthoor, Francky ; DeMan, H.
Keywords :
Automata; Automatic testing; Built-in self-test; Circuit faults; Fault detection; Laboratories; Optimization methods; Read only memory; Telephony; Test pattern generators;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527811
