Title :
Extraction of conversion matrices for P-HEMTs based on vectorial large-signal measurements
Author :
Cidronali, A. ; Gupta, K.C. ; Jargon, J. ; Remley, K.A. ; DeGroot, D. ; Manes, G.
Author_Institution :
Dept. of Electron. & Telecommun., Florence Univ. Dept. Electron., Italy
Abstract :
We introduce a new technique which allows us to measure the admittance conversion matrix of a two port device, using a large-signal vector network analyzer. This method is applied to extract the conversion matrix of a 0.25 um PHEMT, driven by a 4.8 GHz signal, at different power levels, using an intermediate frequency of 600 MHz. A discussion of the up- and down-conversion is provided.
Keywords :
high electron mobility transistors; microwave field effect transistors; microwave frequency convertors; network analysers; semiconductor device measurement; 0.25 micron; 4.8 GHz; 600 MHz; P-HEMT; admittance conversion matrix; large-signal measurement; microwave frequency converter; nonlinear vector network analyzer; parameter extraction; two-port device; Calibration; Computer networks; Data acquisition; Frequency conversion; Frequency measurement; NIST; Phase measurement; Radio frequency; Scattering parameters; Telecommunication computing;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1212486
