Title :
Automatic clock jitter analysis considering clock divider
Author :
Jin, Woojin ; Kim, Moon-su ; Jo, Chan-min ; Won, Hyosig ; Choi, Kyu-Myung
Author_Institution :
Design Technol. Team, Samsung Electronics Co., Ltd., Yongin, South Korea
Abstract :
Clock jitter can cause degradation in the system performance. New and efficient clock jitter analysis methodology is presented in this paper. Odd-number clock divider as well as even-number clock divider can be automatically taken into consideration during clock jitter analysis. Furthermore, worst case clock jitter analysis is possible since the state dependency is also considered. This methodology has been compared with the measured data of silicon. Even though monitoring points of simulation and measurement are different, the accuracy of simulation is within 20% compared to the measurement data.
Keywords :
clocks; jitter; automatic clock jitter analysis; even-number clock divider; odd-number clock divider; Analog circuits; Clocks; Crosstalk; Degradation; Delay; Fluctuations; Frequency synchronization; Jitter; System performance; Uncertainty; Clock Divider; Clock Jitter; Clock Network; IVD;
Conference_Titel :
SoC Design Conference (ISOCC), 2009 International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5034-3
Electronic_ISBN :
978-1-4244-5035-0
DOI :
10.1109/SOCDC.2009.5423857