• DocumentCode
    1645583
  • Title

    The behavioral modeling of microwave/RF ICs using non-linear time series analysis

  • Author

    Wood, J. ; Root, D.E.

  • Author_Institution
    Microwave Technol. Center, Agilent Technol. Inc., Santa Rosa, CA, USA
  • Volume
    2
  • fYear
    2003
  • Firstpage
    791
  • Abstract
    A new and powerful, systematic approach for creating nonlinear behavioral models of microwave/RF ICs is presented. The methodology incorporates several techniques from nonlinear dynamics, system identification, and computational geometry to produce models that are an effective compromise between complexity and accuracy, and efficiency and speed of simulation. The models are constructed from large-signal microwave measurements in the time domain, or from simulation, and are implemented in a commercial nonlinear microwave simulator. We illustrate the technique by creating a cascadable, transportable model of a microwave IC amplifier that predicts accurately the DC, large signal, harmonic distortion, inter-modulation, and small-signal S-parameter behavior.
  • Keywords
    S-parameters; harmonic distortion; integrated circuit modelling; intermodulation distortion; microwave integrated circuits; radiofrequency integrated circuits; time series; DC characteristics; RF IC; behavioral model; cascadable transportable model; computational geometry; harmonic distortion; intermodulation distortion; microwave IC; microwave IC amplifier; nonlinear dynamics; nonlinear simulation; nonlinear time series analysis; small-signal S-parameters; system identification; time-domain large-signal measurement; Computational geometry; Computational modeling; Distortion measurement; Integrated circuit modeling; Nonlinear dynamical systems; Power system modeling; Radio frequency; Solid modeling; System identification; Time series analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1212489
  • Filename
    1212489