Title :
Fast eye diagram determination for the signal integrity verification of frequency-variant transmission lines
Author :
Kim, Hyunsik ; Kim, Dongchul ; Eo, Yungseon
Author_Institution :
Dept. of Electr. & Comput. Eng., Hanyang Univ., Ansan, South Korea
Abstract :
A new efficient and accurate eye diagram determination technique is presented. In order to estimate the worst case eye diagram, bit streams which may induce the worst ISI (inter symbol interference) are determined. Then the output responses for worst case bit streams are determined by using fast Fourier transform technique. The proposed technique is compared with SPICE simulation that employs PRBS (pseudorandom bit sequence) input signals.
Keywords :
fast Fourier transforms; intersymbol interference; logic design; random sequences; bit stream; fast Fourier transform; fast eye diagram determination; frequency-variant transmission lines; inter symbol interference; pseudorandom bit sequence; signal integrity verification; Bismuth; Fast Fourier transforms; Frequency domain analysis; Frequency estimation; Intersymbol interference; SPICE; Semiconductor process modeling; Signal analysis; Transient response; Transmission lines; Eye-diagram; frequency-variant characteristics; signal integrity; signal transient response; transmission line;
Conference_Titel :
SoC Design Conference (ISOCC), 2009 International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5034-3
Electronic_ISBN :
978-1-4244-5035-0
DOI :
10.1109/SOCDC.2009.5423860
