• DocumentCode
    1645844
  • Title

    The impact of terrestrial radiation effects on the reliability of a smart grid

  • Author

    Yao, Xiaoyin ; Ni, Hui ; Vera, G. Alonzo

  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper analyzes the impact of terrestrial radiation effects on the reliability of a Smart Grid. The mechanisms of radiation effects on semiconductor devices are briefly introduced and mitigation techniques are presented. Since this is a new research area, the future directions in it are discussed.
  • Keywords
    power system reliability; radiation effects; smart power grids; mitigation techniques; semiconductor devices; smart grid reliability; terrestrial radiation effects; Power system reliability; Radiation effects; Reliability; Semiconductor devices; Sensors; Smart grids; radiation effects; reliability; smart grid; terrestrial radiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovative Smart Grid Technologies (ISGT), 2012 IEEE PES
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4577-2158-8
  • Type

    conf

  • DOI
    10.1109/ISGT.2012.6175821
  • Filename
    6175821
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1645844