• DocumentCode
    1645855
  • Title

    Self-test scheduling with bounded test execution time

  • Author

    Stroele, Albrecht P.

  • fYear
    1995
  • Firstpage
    130
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Hardware; Logic testing; Registers; Scheduling; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527813
  • Filename
    527813
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1645855