Title :
Reliability of microcircuits through partial discharge measurements
Author :
Wahidabanu, R.S.D. ; Selvam, M. A Panneer ; Udayakumar, K.
Author_Institution :
Anna Univ., Madras, India
Abstract :
Partial discharge measurements are of great importance in quality assurance of high voltage (HV) apparatus. Due to microminiaturisation and greatly decreased insulation distances, PD measurements are of increasing importance, even for low voltage (LV) components and equipments. Hence an attempt is made to determine the quality of coated printed circuit boards using the PD measurements. Sources of discharges are quantified for further processing and unambiguous recognition of various sources is obtained
Keywords :
circuit reliability; partial discharges; printed circuit testing; quality control; low voltage component; microcircuit reliability; partial discharge measurement; printed circuit board; quality assurance; Circuit testing; Coatings; Gold; Insulation life; Insulation testing; Nickel; Nondestructive testing; Partial discharge measurement; Partial discharges; Voltage;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.617584
