DocumentCode
1645921
Title
Closed-form formula for frequency dependent bonding pad characterization
Author
Xiangyin Zeng ; Abdulla, M. ; Qing-Lun Chen
Author_Institution
Intel China Software Lab, Shanghai, China
Volume
2
fYear
2003
Firstpage
837
Abstract
It is well known that on-die bonding pad capacitance and conductance is quite frequency-dependent due to the existence of lossy substrate. This paper describes a very simple yet accurate method to determine them. The pad capacitance is divided into two parts, the parallel plate capacitance and the fringing capacitance. By taking the bonding pad as a transmission line four times, we can determine the fringing capacitances along the four edges. Closed-form formulas for all the capacitances are available. The conductance can then be determined from the capacitance. The results show good agreement with the full wave simulation results, which justifies the validity of our modeling.
Keywords
integrated circuit bonding; transmission line theory; bonding pad; closed-form formula; conductance; frequency dependence; fringing capacitance; full-wave simulation; lossy substrate; parallel plate capacitance; transmission line; Atherosclerosis; Bonding; Circuit simulation; Frequency dependence; Green function; Integrated circuit measurements; Parasitic capacitance; Semiconductor device measurement; Silicon; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location
Philadelphia, PA, USA
ISSN
0149-645X
Print_ISBN
0-7803-7695-1
Type
conf
DOI
10.1109/MWSYM.2003.1212500
Filename
1212500
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