• DocumentCode
    1645921
  • Title

    Closed-form formula for frequency dependent bonding pad characterization

  • Author

    Xiangyin Zeng ; Abdulla, M. ; Qing-Lun Chen

  • Author_Institution
    Intel China Software Lab, Shanghai, China
  • Volume
    2
  • fYear
    2003
  • Firstpage
    837
  • Abstract
    It is well known that on-die bonding pad capacitance and conductance is quite frequency-dependent due to the existence of lossy substrate. This paper describes a very simple yet accurate method to determine them. The pad capacitance is divided into two parts, the parallel plate capacitance and the fringing capacitance. By taking the bonding pad as a transmission line four times, we can determine the fringing capacitances along the four edges. Closed-form formulas for all the capacitances are available. The conductance can then be determined from the capacitance. The results show good agreement with the full wave simulation results, which justifies the validity of our modeling.
  • Keywords
    integrated circuit bonding; transmission line theory; bonding pad; closed-form formula; conductance; frequency dependence; fringing capacitance; full-wave simulation; lossy substrate; parallel plate capacitance; transmission line; Atherosclerosis; Bonding; Circuit simulation; Frequency dependence; Green function; Integrated circuit measurements; Parasitic capacitance; Semiconductor device measurement; Silicon; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1212500
  • Filename
    1212500