DocumentCode :
1645921
Title :
Closed-form formula for frequency dependent bonding pad characterization
Author :
Xiangyin Zeng ; Abdulla, M. ; Qing-Lun Chen
Author_Institution :
Intel China Software Lab, Shanghai, China
Volume :
2
fYear :
2003
Firstpage :
837
Abstract :
It is well known that on-die bonding pad capacitance and conductance is quite frequency-dependent due to the existence of lossy substrate. This paper describes a very simple yet accurate method to determine them. The pad capacitance is divided into two parts, the parallel plate capacitance and the fringing capacitance. By taking the bonding pad as a transmission line four times, we can determine the fringing capacitances along the four edges. Closed-form formulas for all the capacitances are available. The conductance can then be determined from the capacitance. The results show good agreement with the full wave simulation results, which justifies the validity of our modeling.
Keywords :
integrated circuit bonding; transmission line theory; bonding pad; closed-form formula; conductance; frequency dependence; fringing capacitance; full-wave simulation; lossy substrate; parallel plate capacitance; transmission line; Atherosclerosis; Bonding; Circuit simulation; Frequency dependence; Green function; Integrated circuit measurements; Parasitic capacitance; Semiconductor device measurement; Silicon; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1212500
Filename :
1212500
Link To Document :
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