• DocumentCode
    1646002
  • Title

    CMOS Photonics Technology Overview

  • Author

    Gunn, Cary

  • Author_Institution
    Luxtera, Inc., Carlsbad, CA
  • fYear
    2006
  • Firstpage
    139
  • Lastpage
    140
  • Abstract
    At Luxtera, we have developed a complete suite of optical capability by using a standard 130nm SOI CMOS process at Freescale Semiconductor. This library of optical functions allows the design and fabrication of complex optical and electrical systems on a small silicon chip. While photodetectors, modulators, and optical filters have been implemented in or on silicon (Soref and Bennett, 1987), the technology discussed herein refers solely to implementations of technology within the constraints of a working CMOS process - thus leading to the term "CMOS photonics." The key test for an element of CMOS photonics technology is that the yield and performance of the transistors on the same substrate is not modified by the presence of the optics. An overview of the technology is shown. This paper will start with a brief discussion of the electronics, and then will follow the path of the light as it\´s used to transmit data between chips, eventually terminating at the germanium photodetector
  • Keywords
    CMOS integrated circuits; elemental semiconductors; germanium; integrated optoelectronics; photodetectors; silicon; silicon-on-insulator; 130 nm; CMOS photonics; Freescale Semiconductor; Ge; Luxtera; SOI CMOS process; Si; electrical systems; germanium photodetector; optical filters; optical functions; optical systems; optical transceiver; silicon chip; silicon modulator; silicon photonics; transistor yield; CMOS process; CMOS technology; Libraries; Optical design; Optical filters; Optical modulation; Photodetectors; Photonics; Silicon; Standards development; CMOS Photonics; germanium photodetector; optical transceiver; silicon modulator; silicon photonics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium, 2006. CSIC 2006. IEEE
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    1-4244-0126-7
  • Electronic_ISBN
    1-4244-0127-5
  • Type

    conf

  • DOI
    10.1109/CSICS.2006.319929
  • Filename
    4110001