• DocumentCode
    1646033
  • Title

    Integration and design issues in combining very-high-speed silicon-germanium bipolar transistors and ULSI CMOS for system-on-a-chip applications

  • Author

    Subbanna, S. ; Freeman, G. ; Ahlgren, D. ; Greenberg, D. ; Harame, D. ; Dunn, J. ; Herman, D. ; Meyerson, B. ; Greshishchev, Y. ; Schvan, P. ; Thornberry, D. ; Sakamoto, G. ; Tayrani, R.

  • Author_Institution
    IBM Microelectron., Hopewell Junction, NY, USA
  • fYear
    1999
  • Firstpage
    845
  • Lastpage
    848
  • Abstract
    In the last decade, silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) BICMOS technology has developed from being a lab curiosity to becoming a production manufacturing technology that replaces and extends the performance of silicon-based BICMOS technology. The impetus for this development has been the insatiable requirement for bandwidth in network communication at speeds up to 40 Gbit/s and the rapid growth of the global cellular and wireless LAN markets. To meet the stringent criteria of many of these communications protocols, SiGe technology offers a cost-effective system-level solution compared to gallium-arsenide and other approaches. This paper will focus on integration, manufacturing and design issues in SiGe BICMOS circuits and systems, based on 15 years of work in our labs and fabs, and 4 generations of scaling CMOS-compatible SiGe, with concrete examples.
  • Keywords
    BiCMOS integrated circuits; Ge-Si alloys; ULSI; heterojunction bipolar transistors; high-speed integrated circuits; semiconductor materials; BiCMOS technology; CMOS ULSI; Si-Ge; system-on-a-chip; very-high-speed silicon-germanium heterojunction bipolar transistor; Bandwidth; BiCMOS integrated circuits; Cellular networks; Germanium silicon alloys; Heterojunction bipolar transistors; Manufacturing; Production; Protocols; Silicon germanium; Wireless LAN;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-5410-9
  • Type

    conf

  • DOI
    10.1109/IEDM.1999.824281
  • Filename
    824281