• DocumentCode
    1646088
  • Title

    Can concurrent checkers help BIST?

  • Author

    Gupta, Sandeep K. ; Pradhan, Dhiraj K.

  • fYear
    1995
  • Firstpage
    140
  • Keywords
    Availability; Built-in self-test; Circuit testing; Concurrent computing; Costs; Design methodology; Fault diagnosis; Fault tolerant systems; Hardware; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527814
  • Filename
    527814
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1646088