Title :
Immunity testing on extended systems
Author_Institution :
Dept. of Reactor Services, Sensors & Instrum., AEA Technol.,, Warrington, UK
fDate :
9/21/1993 12:00:00 AM
Abstract :
The immunity to electrical interference of an extended system, where transducers and signal processors are separated but in electrical contact, is frequently worse than that of its constituent parts. For small systems it may be possible to carry out tests in the laboratory but may be more practical to conduct tests at the manufacturers works or at the installation. In practice, system immunity will degrade with time and on-site testing can establish immunity performance levels and indicate degradation trends. The author describes the test system
Keywords :
electromagnetic compatibility; electromagnetic interference; electronic equipment testing; standards; test equipment; test facilities; EMC; degradation trends; electrical interference; electromagnetic compatibility; extended systems; performance levels; signal processors; susceptibility; system immunity; testing; transducers;
Conference_Titel :
Low Cost EMC Testing, IEE Colloquium on
Conference_Location :
London
