DocumentCode :
1646322
Title :
I
DDQ
TESTING IN CMOS DIGITAL ASIC´S - PUTTING IT ALL TOGETHER
Author :
Perry, Roger
fYear :
1992
Firstpage :
151
Keywords :
Application specific integrated circuits; Automatic testing; CMOS technology; Circuit faults; Clocks; Current measurement; Electronics packaging; Failure analysis; Latches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1992. Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-7803-0760-7
Type :
conf
DOI :
10.1109/TEST.1992.527815
Filename :
527815
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1646322
