Title :
A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC
Author :
Son, Hyeonuk ; Jang, Jaewon ; Kim, Youbean ; Kim, Kicheol ; Kim, Incheol ; Kang, Sungho
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
The proposed built-in self-test(BIST) architecture aims at multiple digital-to-analog converters (DACs) in a low temperature poly-silicon(LTPS) based thin-film transistor liquid crystal display(TFT-LCD) source driver IC. DACs play an important role in display driver ICs(DDIs), so the proposed BIST is indispensable for DDIs´ testing. The proposed BIST can compute differential non-linearity(DNL), integral non-linearity(INL) and timing errors using some basic modules. The proposed architecture benefits the hardware overhead and the test application time without the loss of test quality. The validity and the effectiveness of the proposed method are verified through HSPICE simulations with an LTPS process.
Keywords :
SPICE; built-in self test; digital-analogue conversion; driver circuits; liquid crystal displays; thin film transistors; BIST architecture; HSPICE simulations; LTPS TFT-LCD source driver IC; built-in self-test; differential nonlinearity; digital-to-analog converters; display driver IC; integral nonlinearity; low temperature poly-silicon; multiple DAC; thin-film transistor liquid crystal display; Automatic testing; Built-in self-test; Computer architecture; Digital integrated circuits; Digital-analog conversion; Driver circuits; Integrated circuit testing; Liquid crystal displays; Temperature; Thin film transistors; DAC BIST; LTPS DDI; source driver IC testing;
Conference_Titel :
SoC Design Conference (ISOCC), 2009 International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5034-3
Electronic_ISBN :
978-1-4244-5035-0
DOI :
10.1109/SOCDC.2009.5423890
