• DocumentCode
    1646475
  • Title

    Integrated power amplifier for 60 GHz wireless applications

  • Author

    Varonen, M. ; Karkkainen, Mikko ; Kangaslahti, P. ; Porra, V.

  • Author_Institution
    Electron. Circuit Design Lab., Helsinki Univ. of Technol., Espoo, Finland
  • Volume
    2
  • fYear
    2003
  • Firstpage
    915
  • Abstract
    This paper presents an integrated power amplifier for the 60 GHz frequency range. The amplifier was fabricated with a commercially available 0.15 /spl mu/m gate length pseudomorphic HEMT process. The output stage consists of two 6/spl times/35 /spl mu/m PHEMTs, forming a total output periphery of 420 /spl mu/m. The MMIC amplifier was simulated, fabricated and measured both on-wafer and in a split block package. The amplifier was characterized using linear and nonlinear methods. The odd mode stability was carefully analyzed. Large-signal scattering parameters were measured with on-wafer probes. The measured gain was 13.4 dB and 1 dB output compression point was at +17 dBm power level using 3.0 V supply voltage. The AM/AM and AM/PM characteristics were extracted from the large-signal S-parameter results. Finally, the amplifier chip was mounted in a split block package, which has WR-15 wave guide input and output interface. The measured results show 12.5 dB small-signal gain and better than 8 dB return losses in input and output for the packaged amplifier chip.
  • Keywords
    HEMT integrated circuits; MMIC power amplifiers; S-parameters; field effect MMIC; millimetre wave power amplifiers; 0.15 micron; 12.5 dB; 13.4 dB; 3.0 V; 60 GHz; 8 dB; AM/AM characteristics; AM/PM characteristics; PHEMT MMIC; WR-15 waveguide interface; integrated power amplifier; large-signal S-parameters; odd mode stability; on-wafer probe; return loss; small-signal gain; split block package; wireless communication; Frequency; Gain measurement; MMICs; PHEMTs; Packaging; Power amplifiers; Probes; Scattering parameters; Semiconductor device measurement; Stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1212518
  • Filename
    1212518